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X-ray diffraction profiles of Si nanowires with trapezoidal cross-sections

✍ Scribed by Teruaki Takeuchi; Kosuke Tatsumura; Iwao Ohdomari; Takayoshi Shimura; Masao Nagase

Book ID: 104081879
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 837 KB
Volume: 406
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2011.03.064

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