Structural polytypism and residual strain in GaAs nanowires grown on Si(111) probed by single-nanowire X-ray diffraction

✍ Scribed by Biermanns, Andreas ;Breuer, Steffen ;Davydok, Anton ;Geelhaar, Lutz ;Pietsch, Ullrich

• Book ID: 114497428
• Publisher: International Union of Crystallography
• Year: 2012
• Tongue: English
• Weight: 896 KB
• Volume: 45
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889812003007