X-ray diffraction line profile analysis for defect study in Cu-1 wt.% Cr-0.1 wt.% Zr alloy

✍ Scribed by K. Kapoor; D. Lahiri; I.S. Batra; S.V.R. Rao; T. Sanyal

• Book ID: 113779799
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 439 KB
• Volume: 54
• Category: Article
• ISSN: 1044-5803
• DOI: 10.1016/j.matchar.2004.09.009