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X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

✍ Scribed by K. Kapoor; D. Lahiri; S. V. R. Rao; T. Sanyal; B. P. Kashyap

Book ID: 110644452
Publisher: Springer-Verlag
Year: 2004
Tongue: English
Weight: 230 KB
Volume: 27
Category: Article
ISSN: 0250-4707
DOI: 10.1007/bf02708487

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