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X-ray diffraction analysis of silicon prepared from rice husk ash

✍ Scribed by Nazma Ikram; M. Akhter


Publisher
Springer
Year
1988
Tongue
English
Weight
240 KB
Volume
23
Category
Article
ISSN
0022-2461

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## Abstract The bonding and crystalline structures of oil‐fried fly ash collected from a power plant were analyzed by using Raman spectroscopy and X‐ray diffraction (XRD), respectively. These carbon powders underwent a series of annealing treatment for graphitization and crystallization. In Raman s