Raman and X-ray diffraction analysis on unburned carbon powder refined from fly ash

✍ Scribed by F. C. Tai; C. Wei; S. H. Chang; W. S. Chen

• Publisher: John Wiley and Sons
• Year: 2009
• Tongue: English
• Weight: 214 KB
• Volume: 41
• Category: Article
• ISSN: 0377-0486
• DOI: 10.1002/jrs.2532

✦ Synopsis

Abstract

The bonding and crystalline structures of oil‐fried fly ash collected from a power plant were analyzed by using Raman spectroscopy and X‐ray diffraction (XRD), respectively. These carbon powders underwent a series of annealing treatment for graphitization and crystallization. In Raman spectra, the refined, unburned carbon contains clearly the D, G and D′ peaks under 2000 or 2700 °C treatment. The Raman spectral line shape of refined, unburned carbon heated at 2700 °C is similar to that of commercial graphite made from graphitization process. In the XRD spectra, the refined, unburned carbon contains (002), (100) and (004) diffraction peaks under heating at 2000 or 2700 °C. The XRD spectral line shape of refined, unburned carbon heated at 2700 °C is similar to that of a commercial graphite bar. The quantitative graphitization level from Raman spectra and crystallization degree from XRD spectra on refined, unburned carbon powders serve as preliminary guide for the qualitative evaluation of these unburned carbon powders. Copyright © 2009 John Wiley & Sons, Ltd.