X-ray diffraction analysis of multilayer porous InP(001) structure
✍ Scribed by A. A. Lomov; V. I. Punegov; A. L. Vasil’ev; D. Nohavica; P. Gladkov; A. A. Kartsev; D. V. Novikov
- Book ID
- 111438296
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2010
- Tongue
- English
- Weight
- 488 KB
- Volume
- 55
- Category
- Article
- ISSN
- 1063-7745
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
## Abstract A high resolution X‐ray diffraction method has been effectively used for the structural characterization of InP porous layers. It was revealed that strong diffuse scattering from pores around reciprocal lattice points does depend on the azimuth positions of samples. To extract structura
## Abstract The dynamical recurrence relation for amplitudes of coherent waves in the multilayered structure with Coulomb‐type defects (2D and 3D defects or microdefects) has been derived and the expression for the diffuse component of reflection coefficient of this structure has been obtained with