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X-ray diffraction study of the morphology and structure of pulse-anodized porous Si multilayers

✍ Scribed by A. A. Lomov; V. A. Karavanskiĭ; A. L. Vasil’ev; D. V. Novikov

Book ID: 111437990
Publisher: SP MAIK Nauka/Interperiodica
Year: 2008
Tongue: English
Weight: 389 KB
Volume: 53
Category: Article
ISSN: 1063-7745
DOI: 10.1134/s1063774508050039

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