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Optical and X-ray diffraction studies of multilayer structures based on InGaN/GaN solid solutions

✍ Scribed by S. O. Usov; A. F. Tsatsul’nikov; E. E. Zavarin; R. N. Kyutt; N. N. Ledentsov

Book ID: 111446591
Publisher: SP MAIK Nauka/Interperiodica
Year: 2009
Tongue: English
Weight: 223 KB
Volume: 51
Category: Article
ISSN: 1063-7834
DOI: 10.1134/s1063783409080162

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