𝔖 Bobbio Scriptorium
✦   LIBER   ✦

X-ray diffraction analysis of damage accumulation due to the nuclear energy loss of 50 keV and 1–2.2 MeV B ions implanted in silicon

✍ Scribed by R. Fabbri; G. Lulli; R. Nipoti; M. Servidori


Book ID
113284740
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
230 KB
Volume
80-81
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES