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X-ray diffraction analyses of RF sputtered Ba0.6Sr0.4TiO3thin films grown on Pt/Ti/LaAlO3(100) substrates

✍ Scribed by Chen, Hongwei; Tan, Yu; Ji, Hong; Chen, Linling; Zeng, Li; Liu, Lang; Zhang, Jihua; Yang, Chuanren

No coin nor oath required. For personal study only.

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