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X-Ray analysis specimen holder for TEM grids for use in a SEM

โœ Scribed by E. D. Glover; W. N. Hauser

Book ID
112188054
Publisher
Hindawi Limited
Year
1981
Tongue
English
Weight
658 KB
Volume
4
Category
Article
ISSN
0161-0457

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Modification of a TEM-goniometer specime
Modification of a TEM-goniometer specimen holder to enable beam current measurements in a (S)TEM for use in quantitative X-ray microanalysis
โœ Stols, A. L. H. ;Smits, H. T. J. ;Stadhouders, A. M. ๐Ÿ“‚ Article ๐Ÿ“… 1986 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 382 KB

In order to have available a specimen holder suited to measure the beam current as is often required in quantitative electron probe X-ray microanalysis, the rod of a low background beryllium specimen holder of a transmission electron microscope was modified. The tip was electrically insulated from t