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A low background TEM specimen holder for quantitative X-ray microanalysis and simultaneous specimen current measurement

✍ Scribed by H.T.J. Smits; P.W.J. Linders; A.L.H. Stols; A.M. Stadhouders

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 92 KB
Volume: 9
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(82)90134-6

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