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A simple SEM specimen holder for use in sputtering yield measurements

✍ Scribed by Mogens Jaehger

Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
53 KB
Volume
32
Category
Article
ISSN
0042-207X

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πŸ“œ SIMILAR VOLUMES

Modification of a TEM-goniometer specime
Modification of a TEM-goniometer specimen holder to enable beam current measurements in a (S)TEM for use in quantitative X-ray microanalysis
✍ Stols, A. L. H. ;Smits, H. T. J. ;Stadhouders, A. M. πŸ“‚ Article πŸ“… 1986 πŸ› Wiley (John Wiley & Sons) 🌐 English βš– 382 KB

In order to have available a specimen holder suited to measure the beam current as is often required in quantitative electron probe X-ray microanalysis, the rod of a low background beryllium specimen holder of a transmission electron microscope was modified. The tip was electrically insulated from t