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X-ray absorption spectroscopy study at the Si K-edge of tungsten carbide–silicon carbide thin films

✍ Scribed by J.E. Krzanowski; S. Palacín; A. Gutiérrez; F. Schäfers; M. Mertin; J.L. Endrino; L. Soriano

Book ID: 113896665
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 874 KB
Volume: 56
Category: Article
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2007.03.001

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X-ray absorption spectroscopy study at the Si&#xa0;K-edge of tungsten carbide–silicon carbide thin films

X-ray absorption spectroscopy study at the Si K-edge of tungsten carbide–silicon carbide thin films