X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L[sub 3,2] edge

✍ Scribed by Sun, X.-H.; Tang, Y.-H.; Zhang, P.; Naftel, S. J.; Sammynaiken, R.; Sham, T. K.; Peng, H. Y.; Zhang, Y.-F.; Wong, N. B.; Lee, S. T.

• Book ID: 127304099
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 307 KB
• Volume: 90
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1417997