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Structure and electronic properties of SiO[sub 2]/Si multilayer superlattices: Si K edge and L[sub 3,2] edge x-ray absorption fine structure study

✍ Scribed by Sammynaiken, R.; Naftel, S. J.; Sham, T. K.; Cheah, K. W.; Averboukh, B.; Huber, R.; Shen, Y. R.; Qin, G. G.; Ma, Z. C.; Zong, W. H.

Book ID: 127233421
Publisher: American Institute of Physics
Year: 2002
Tongue: English
Weight: 287 KB
Volume: 92
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1501742

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