X-ray absorption analysis of structural disorder in amorphous silicon

✍ Scribed by A. Di Cicco; A. Bianconi; C. Coluzza; P. Rudolf; P. Lagarde; A.M. Flank; A. Marcelli

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 196 KB
• Volume: 158
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/0921-4526(89)90401-8