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Structure Analysis of InN Film Using Extended X-Ray Absorption Fine Structure Method

✍ Scribed by T. Miyajima; Y. Kudo; K.-L. Liu; T. Uruga; T. Honma; Y. Saito; M. Hori; Y. Nanishi; T. Kobayashi; S. Hirata

No coin nor oath required. For personal study only.

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