𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Window for better reliability of nitride heterostructure field effect transistors

✍ Scribed by A. Matulionis; J. Liberis; E. Šermukšnis; L. Ardaravičius; A. Šimukovič; C. Kayis; C.Y. Zhu; R. Ferreyra; V. Avrutin; Ü. Özgür; H. Morkoç

Book ID
119326705
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
719 KB
Volume
52
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Novel fluctuation-based approach to opti
Novel fluctuation-based approach to optimization of frequency performance and degradation of nitride heterostructure field effect transistors
✍ Matulionis, A. ;Liberis, J. ;Matulionienė, I. ;Šermukšnis, E. ;Leach, J. H. ;Wu, 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 470 KB

## Abstract The fluctuation‐based technique has been used to shed light onto the physical processes responsible for the performance of nitride heterostructure field effect transistors. A non‐monotonic dependence of hot‐phonon lifetime on the density of two‐dimensional electron gas (2DEG) is found a