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Weibull breakdown characteristics and oxide thickness uniformity

✍ Scribed by Wu, E.Y.; Nowak, E.J.; Vollertsen, R.-P.; Han, L.-K.

Book ID: 114538466
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 231 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.887012

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