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Waveguide technique for measuring thin film parameters

✍ Scribed by A. V. Khomchenko; A. B. Sotsky; A. A. Romanenko; E. V. Glazunov; A. V. Shulga


Book ID
110143238
Publisher
Springer
Year
2005
Tongue
English
Weight
110 KB
Volume
50
Category
Article
ISSN
1063-7842

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