Support Vector Regression for Measuring Electromagnetic Parameters of Magnetic Thin-Film Materials

✍ Scribed by Yunqiu Wu; Zongxi Tang; Yuehang Xu; Yunchuan Guo; Biao Zhang

• Book ID: 114652326
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 209 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2007.908372