𝔖 Bobbio Scriptorium
✦   LIBER   ✦

RF measurement technique for characterizing thin dielectric films

✍ Scribed by Zhengxiang Ma; Becker, A.J.; Polakos, P.; Huggins, H.; Pastalan, J.; Hui Wu; Watts, K.; Wong, Y.H.; Mankiewich, P.

Book ID
114537400
Publisher
IEEE
Year
1998
Tongue
English
Weight
147 KB
Volume
45
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Measurement technique for characterizing
Measurement technique for characterizing memory effects in RF power amplifiers
✍ Vuolevi, J.H.K.; Rahkonen, T.; Manninen, J.P.A. πŸ“‚ Article πŸ“… 2001 πŸ› IEEE 🌐 English βš– 99 KB

Memory effects are defined as changes in the amplitude and phase of distortion components caused by changes in modulation frequency. These are particularly important in cancelling linearizer systems, e.g., when distortion is reduced by similar distortion in the opposite phase. This paper begins by d