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Comparison of two techniques for reliable characterization of thin metal–dielectric films

✍ Scribed by Amotchkina, Tatiana V. ;Trubetskov, Michael K. ;Tikhonravov, Alexander V. ;Janicki, Vesna ;Sancho-Parramon, Jordi ;Zorc, Hrvoje

No coin nor oath required. For personal study only.

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