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Measurement technique for characterizing memory effects in RF power amplifiers

โœ Scribed by Vuolevi, J.H.K.; Rahkonen, T.; Manninen, J.P.A.


Book ID
114554132
Publisher
IEEE
Year
2001
Tongue
English
Weight
99 KB
Volume
49
Category
Article
ISSN
0018-9480

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Measurement technique for characterizing
โœ Vuolevi, J.H.K.; Rahkonen, T.; Manninen, J.P.A. ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› IEEE ๐ŸŒ English โš– 99 KB

Memory effects are defined as changes in the amplitude and phase of distortion components caused by changes in modulation frequency. These are particularly important in cancelling linearizer systems, e.g., when distortion is reduced by similar distortion in the opposite phase. This paper begins by d