WA-A7 the effect of electron trapping on the performance of short-channel MOS/Bulk and MOS/SOS transistors

✍ Scribed by Sun, E.; Alders, B.; Forbes, L.

• Book ID: 114593248
• Publisher: IEEE
• Year: 1979
• Tongue: English
• Weight: 167 KB
• Volume: 26
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1979.19761