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Measurements on depletion-mode field effect transistors and buried channel MOS capacitors for the characterization of bulk transfer charge-coupled devices

✍ Scribed by A.M. Mohsen; F.J. Morris

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 979 KB
Volume: 18
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(75)90042-8

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