Measurements on depletion-mode field effect transistors and buried channel MOS capacitors for the characterization of bulk transfer charge-coupled devices : A. M. Mohsen and F. J. Morris. Solid-St. Electron. 18, 407 (1975)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 127 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90261-9