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Measurements on depletion-mode field effect transistors and buried channel MOS capacitors for the characterization of bulk transfer charge-coupled devices : A. M. Mohsen and F. J. Morris. Solid-St. Electron. 18, 407 (1975)


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
127 KB
Volume
14
Category
Article
ISSN
0026-2714

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