𝔖 Bobbio Scriptorium
✦   LIBER   ✦

VLSI testing


Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
503 KB
Volume
5
Category
Article
ISSN
0141-9331

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The increasing capability of being able to fabricate a very large number of transistors on a single integrated-circuit chip and the complexity of the possible systems has increased the importance of being able to test such circuits in an acceptable way and in an acceptable time. The time difficultie