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Fairchild system tests VLSI components

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

VLSI testing with CAD-linked electron be

✍ Koji Nakamae; Katsuyoshi Miura; Hiromu Fujioka 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 995 KB

GenRad VLSI test system now in Europe

📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 112 KB

Intelligent electro-magnetic system test

✍ Wells Krautkramer 📂 Article 📅 1989 🏛 Elsevier Science ⚖ 142 KB

VLSI-chip test system tests itself at bo

📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 123 KB

4680761 Self diagnostic cyclic analysis

✍ Donald Burkness 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 68 KB

Performing integrated system tests using

✍ Dr. Charalampos Patrikakis; Thomas Kalamaris; Vaios Kakavas 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 170 KB