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VI-8 contactless measurement of minority carrier lifetime in silicon

✍ Scribed by White, J.C.; Unter, T.F.; Smith, J.G.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measurement of minority carrier lifetime

✍ G. Schwab; H. Bernt; H. Reichl 📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 304 KB

Contactless nondestructive technique for

✍ White, J.C.; Unter, T.F.; Smith, J.G. 📂 Article 📅 1977 🏛 Institution of Electrical Engineers ⚖ 733 KB

Erratum: Contactless nondestructive tech

✍ White, J.C.; Unter, T.F.; Smith, J.G. 📂 Article 📅 1977 🏛 Institution of Electrical Engineers ⚖ 109 KB

Minority carrier lifetime measurement in

✍ G. Clément; M. Voos 📂 Article 📅 1968 🏛 Elsevier Science 🌐 English ⚖ 114 KB

Measurement of Minority Carrier Lifetime

✍ J. Noack 📂 Article 📅 1969 🏛 John Wiley and Sons 🌐 English ⚖ 111 KB

Minority carrier lifetime degradation in

✍ Glunz, S. W.; Rein, S.; Lee, J. Y.; Warta, W. 📂 Article 📅 2001 🏛 American Institute of Physics 🌐 English ⚖ 542 KB