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Minority carrier lifetime degradation in boron-doped Czochralski silicon

✍ Scribed by Glunz, S. W.; Rein, S.; Lee, J. Y.; Warta, W.

Book ID: 127370123
Publisher: American Institute of Physics
Year: 2001
Tongue: English
Weight: 542 KB
Volume: 90
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.1389076

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