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Deep level transient spectroscopy and minority carrier lifetime study on Ga-doped continuous Czochralski silicon
✍ Scribed by Yoon, Yohan; Yan, Yixin; Ostrom, Nels P.; Kim, Jinwoo; Rozgonyi, George
- Book ID
- 120425602
- Publisher
- American Institute of Physics
- Year
- 2012
- Tongue
- English
- Weight
- 852 KB
- Volume
- 101
- Category
- Article
- ISSN
- 0003-6951
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