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Measurement of Minority Carrier Lifetime in Silicon of Low Dislocation Density

✍ Scribed by J. Noack

Publisher: John Wiley and Sons
Year: 1969
Tongue: English
Weight: 111 KB
Volume: 32
Category: Article
ISSN: 0370-1972
DOI: 10.1002/pssb.19690320156

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