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Variable Parameter Equivalent Model of Transmission Line Based on Dual-port Norton Equivalence

✍ Scribed by Xiaofeng Zhou; Yanling Wang


Book ID
116426444
Publisher
Elsevier
Year
2012
Weight
372 KB
Volume
16
Category
Article
ISSN
1876-6102

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## Abstract A modified model for RF interconnect bends on lossy substrate in CMOS technology is presented. The model parameters are extracted directly from the on‐wafer S‐parameter measurements. The accuracy is verified up to 20 GHz by the measurements of the test structures. Β© 2005 Wiley Periodica