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Valence-band characterization of InGaAs/GaAs AND GaAs/GaAsP strained-layer structures

✍ Scribed by E.D. Jones; R.M. Biefeld; J.F. Klem; S.K. Lyo; G.C. Osbourn

Book ID: 118363473
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 317 KB
Volume: 228
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(90)90321-x

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