✦ LIBER ✦

Use of side-scanning sonar for contouring bottom features

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 164 KB
Volume: 10
Category: Article
ISSN: 0041-624X
DOI: 10.1016/0041-624x(72)90322-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Linear features on side-scan sonar image

Linear features on side-scan sonar images: An algorithm for the correction of angular distortion

✍ G. Voulgaris; M.B. Collins 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 212 KB

A fiber optic recording oscilloscope for

A fiber optic recording oscilloscope for the display of side-scan sonar and seismic data

✍ James Spottiswoode; Maxwell Dobson 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 375 KB

4134. Inspection for defects of a mask c

4134. Inspection for defects of a mask containing one- to submicrometer patterns using a scanning electron microscope and feature extraction method. (USA)

📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 134 KB

Use of a scanning XRF analysis on SR bea

Use of a scanning XRF analysis on SR beams from VEPP-3 storage ring for research of core bottom sediments from Teletskoe Lake with the purpose of high resolution quantitative reconstruction of last millennium paleoclimate

✍ A.V. Daryin; I.A. Kalugin; N.V. Maksimova; L.G. Smolyaninova; K.V. Zolotarev 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 254 KB

The X-ray Fluorescence (XRF) beamline at the VEPP-3 (Budker Institute of Nuclear Physics, Novosibirsk, Russia) storage ring was modified for the performance of scanning analysis. Scanning Synchrotron Radiation X-ray Fluorescence (SR-XRF) analysis was used for studying of the base and trace elements