Universal Bias Dependence of Excess Current Induced by Self-Heating Effect for a-Si:H TFTs

✍ Scribed by Hsin-Li Chen; Wang-Jung Chen; Po-Yuan Liu; Kuo-Hsing Cheng; Ming-Sheng Lai; Chih-Wei Wang; Chun-Ting Liu

• Book ID: 114618669
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 490 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.893191