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Self-Heating Effect on Bias-Stressed Reliability for Low-Temperature a-Si:H TFT on Flexible Substrate

โœ Scribed by Shih-Chin Kao; Hsiao-Wen Zan; Jung-Jie Huang; Bo-Cheng Kung


Book ID
114619909
Publisher
IEEE
Year
2010
Tongue
English
Weight
491 KB
Volume
57
Category
Article
ISSN
0018-9383

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