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Unification of contemporary negative bias temperature instability models for p-MOSFET energy degradation

✍ Scribed by Karim, Nissar Mohammad; Manzoor, Sadia; Soin, Norhayati

Book ID: 122801722
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 309 KB
Volume: 26
Category: Article
ISSN: 1364-0321
DOI: 10.1016/j.rser.2013.06.004

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