Physical Mechanism and Gate Insulator Material Dependence of Generation and Recovery of Negative-Bias Temperature Instability in p-MOSFETs

✍ Scribed by Varghese, D.; Gupta, G.; Lakkimsetti, L.M.; Saha, D.; Ahmed, K.; Nouri, F.; Mahapatra, S.

• Book ID: 114618797
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 331 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.899425