Recent Issues in Negative-Bias Temperature Instability: Initial Degradation, Field Dependence of Interface Trap Generation, Hole Trapping Effects, and Relaxation

✍ Scribed by Islam, A.E.; Kufluoglu, H.; Varghese, D.; Mahapatra, S.; Alam, M.A.

• Book ID: 114618883
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 401 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2007.902883