𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Undoing measurement-induced dephasing in circuit QED

✍ Scribed by Frisk Kockum, A.; Tornberg, L.; Johansson, G.


Book ID
111903915
Publisher
The American Physical Society
Year
2012
Tongue
English
Weight
358 KB
Volume
85
Category
Article
ISSN
1050-2947

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


The study of ESD induced defects in smar
✍ Hadzi-Vukovic, J. ;Jevtic, M. ;Glavanovics, M. ;Rothleitner, H. πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 330 KB

## Abstract To investigate the reliability of ESD protection in smart power integrated circuits the ESD experiments are performed and degradation is analyzed by low frequency noise measurements. Combining the noise results with further failure analysis analytical methods we have examined a location

Impact of ion cloud densities on the mea
✍ Eric F. Gordon; David C. Muddiman πŸ“‚ Article πŸ“… 2001 πŸ› John Wiley and Sons 🌐 English βš– 207 KB

## Abstract Fundamental research into the quantitative properties of Fourier transform ion cyclotron resonance mass spectrometry (FTICR‐MS) has yielded interesting observations, especially in terms of factors affecting the accuracy of relative ion abundances. However, most of the previous discussio