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Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay

โœ Scribed by Mahan, J.E.; Ekstedt, T.W.; Frank, R.I.; Kaplow, R.

Book ID
114593011
Publisher
IEEE
Year
1979
Tongue
English
Weight
696 KB
Volume
26
Category
Article
ISSN
0018-9383

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The photo-induced open-circuit voltage decay (POVD) method has been used to measure the minority-carrier lifetime on induced pn-junction devices in moderately doped germanium. We found the variations in lifetime with optical illumination intensity, wavelength and temperature depart substantially fro