Measurement and analysis of neutron-induced soft errors in sub-half-micron CMOS circuits

✍ Scribed by Tosaka, Y.; Satoh, S.; Itakura, T.; Ehara, H.; Ueda, T.; Woffinden, G.A.; Wender, S.A.

• Book ID: 114537350
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 124 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.701475