✦ LIBER ✦
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple-Cell Upsets in 10T Subthreshold SRAM
✍ Scribed by Fuketa, Hiroshi; Harada, Ryo; Hashimoto, Masanori; Onoye, Takao
- Book ID
- 120158084
- Publisher
- IEEE
- Year
- 2014
- Tongue
- English
- Weight
- 366 KB
- Volume
- 14
- Category
- Article
- ISSN
- 1530-4388
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