Understanding tunneling magnetoresistance during thermal annealing in MgO-based junctions with CoFeB electrodes

✍ Scribed by Wang, W. G.; Ni, C.; Miao, G. X.; Weiland, C.; Shah, L. R.; Fan, X.; Parson, P.; Jordan-sweet, J.; Kou, X. M.; Zhang, Y. P.; Stearrett, R.; Nowak, E. R.; Opila, R.; Moodera, J. S.; Xiao, J. Q.

• Book ID: 120330454
• Publisher: The American Physical Society
• Year: 2010
• Tongue: English
• Weight: 562 KB
• Volume: 81
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/PhysRevB.81.144406