In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing

✍ Scribed by Wang, W. G.; Jordan-sweet, J.; Miao, G. X.; Ni, C.; Rumaiz, A. K.; Shah, L. R.; Fan, X.; Parsons, P.; Stearrett, R.; Nowak, E. R.; Moodera, J. S.; Xiao, J. Q.

• Book ID: 121506436
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 485 KB
• Volume: 95
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3273397