Uncertainty in measurement of semiconductor piezoresistive sensors
β Scribed by P. L. P. Hoa; G. Gerlach; G. Suchaneck
- Publisher
- Springer-Verlag
- Year
- 2003
- Tongue
- English
- Weight
- 153 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0946-7076
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The piezoresistance of Ge x Si 1Γx (x ΒΌ 0:0120:05) solid solution whiskers with impurity concentrations in the vicinity to metal-insulator transition at the temperature range 4.2-300 K was studied. A 'giant' piezoresistance was found at low temperatures (To50 K) in the samples. The absolute magnitud
The major standard organizations of the world have addressed the issue of reporting uncertainties in measurement reports and certificates. There is, however, still some ambiguity in the minds of many people who try to implement the recommendations in real life. This paper is a contribution to the ru